DocumentCode
1653821
Title
Accurate tap-delay measurements using a di .erential oscillation technique
Author
Petre, O. ; Kerkho, H.G.
Author_Institution
MESA+Research Institute
fYear
2004
Firstpage
10
Lastpage
15
Keywords
CMOS process; CMOS technology; Clocks; Delay; Digital control; Frequency synchronization; Manufacturing; Pins; Semiconductor device measurement; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
Print_ISBN
0-7695-2119-3
Type
conf
DOI
10.1109/ETSYM.2004.1347576
Filename
1347576
Link To Document