• DocumentCode
    1653888
  • Title

    Delay chain based programmable jitter generator

  • Author

    Tian Xia ; Peilin Song ; Jenkins, K.A. ; Jien-Chung Lo

  • Author_Institution
    Univ. of Vermont
  • fYear
    2004
  • Firstpage
    16
  • Lastpage
    21
  • Abstract
    In this paper, we presents a programmable jitter generator. Different from the traditional jitter generator that uses the analog phase modulation (PM) technique to generate only non-Gaussian distributed jitter components, the proposed jitter generator uses digital techniques. It consists of a voltage controlled delay chain, jitter control block, and some basic digital components. It can generate not only the non-Gaussian distributed jitter component, but also the Gaussiandistributed jitter component. In addition, almost all jitter characteristics are controllable. This jitter generator can be used in jitter tolerance test and jitter transfer function measurement. A Xilinx XC4010 FPGA chip is used to validate this design.
  • Keywords
    Automatic generation control; Circuit testing; Delay; Field programmable gate arrays; Phase modulation; Signal analysis; Signal generators; System testing; Timing jitter; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
  • Conference_Location
    Corsica, France
  • Print_ISBN
    0-7695-2119-3
  • Type

    conf

  • DOI
    10.1109/ETSYM.2004.1347578
  • Filename
    1347578