DocumentCode
1653888
Title
Delay chain based programmable jitter generator
Author
Tian Xia ; Peilin Song ; Jenkins, K.A. ; Jien-Chung Lo
Author_Institution
Univ. of Vermont
fYear
2004
Firstpage
16
Lastpage
21
Abstract
In this paper, we presents a programmable jitter generator. Different from the traditional jitter generator that uses the analog phase modulation (PM) technique to generate only non-Gaussian distributed jitter components, the proposed jitter generator uses digital techniques. It consists of a voltage controlled delay chain, jitter control block, and some basic digital components. It can generate not only the non-Gaussian distributed jitter component, but also the Gaussiandistributed jitter component. In addition, almost all jitter characteristics are controllable. This jitter generator can be used in jitter tolerance test and jitter transfer function measurement. A Xilinx XC4010 FPGA chip is used to validate this design.
Keywords
Automatic generation control; Circuit testing; Delay; Field programmable gate arrays; Phase modulation; Signal analysis; Signal generators; System testing; Timing jitter; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
Conference_Location
Corsica, France
Print_ISBN
0-7695-2119-3
Type
conf
DOI
10.1109/ETSYM.2004.1347578
Filename
1347578
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