Title :
Automatic Pattern Generation for Diagnosis of Wiring Interconnect Faults
Author :
Melton, Matthew ; Brglez, Franc
Keywords :
Circuit faults; Costs; Electrical fault detection; Fault detection; Fault diagnosis; Integrated circuit interconnections; Logic; Test pattern generators; Testing; Wiring;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527848