DocumentCode :
1654107
Title :
Architecting a common-source-line array for bipolar non-volatile memory devices
Author :
Zhao, Bo ; Yang, Jun ; Youtao Zhang ; Chen, Yiran ; Li, Hai
Author_Institution :
Dept. of ECE, Univ. of Pittsburgh, Pittsburgh, PA, USA
fYear :
2012
Firstpage :
1451
Lastpage :
1454
Abstract :
Traditional array organization of bipolar non-volatile memories such as STT-MRAM and memristor utilizes two bitlines for cell manipulations. With technology scaling, such bitline pair will soon become the bottleneck of density improvement. In this paper we propose a novel common-source-line array architecture, which uses a shared source-line along the row, leaving only one bitline per column. We also elaborate our design flow towards a reliable common-source-line array design, and demonstrate its effectiveness on STT-MRAM and memristor memory arrays. Our study results show that with comparable latency and energy, the proposed common-source-line array can save 33% and 21.8% area for Memristor-RAM and STT-MRAM respectively, comparing with corresponding traditional dual-bitline array designs.
Keywords :
MRAM devices; integrated circuit design; integrated circuit reliability; memristors; STT-MRAM; bipolar nonvolatile memory devices; cell manipulations; common-source-line array architecture design; dual-bitline array designs; memristor memory arrays; memristor-RAM; shared source-line; Arrays; Memristors; Metals; Microprocessors; Reliability; Resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
Conference_Location :
Dresden
ISSN :
1530-1591
Print_ISBN :
978-1-4577-2145-8
Type :
conf
DOI :
10.1109/DATE.2012.6176594
Filename :
6176594
Link To Document :
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