DocumentCode
1654148
Title
Estimating DPPM during the prototype to product ramp phase
Author
Anderson, Thomas J.
Author_Institution
Texas Instrum. Inc., Dallas, TX, USA
fYear
2005
Firstpage
682
Lastpage
683
Keywords
Pareto analysis; Weibull distribution; failure analysis; integrated circuit reliability; integrated circuit testing; life testing; statistical testing; Weibull distribution; accelerated testing; burn in duration; defect Pareto; defective PPM estimation; early failure rate estimation; failure analysis; failure distribution; failure rate parameter estimation; limited sample size; operational life estimation; process iterations; product use de-rating; prototype to product ramp phase; reliability assessment; sampling statistics; test screen modifications; Acceleration; CMOS technology; Parameter estimation; Phase estimation; Prototypes; Sampling methods; Statistical distributions; Temperature; Testing; Weibull distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International
Print_ISBN
0-7803-8803-8
Type
conf
DOI
10.1109/RELPHY.2005.1493203
Filename
1493203
Link To Document