1654148

Estimating DPPM during the prototype to product ramp phase

Anderson, Thomas J.

Texas Instrum. Inc., Dallas, TX, USA

2005

682

683

Pareto analysis; Weibull distribution; failure analysis; integrated circuit reliability; integrated circuit testing; life testing; statistical testing; Weibull distribution; accelerated testing; burn in duration; defect Pareto; defective PPM estimation; early failure rate estimation; failure analysis; failure distribution; failure rate parameter estimation; limited sample size; operational life estimation; process iterations; product use de-rating; prototype to product ramp phase; reliability assessment; sampling statistics; test screen modifications; Acceleration; CMOS technology; Parameter estimation; Phase estimation; Prototypes; Sampling methods; Statistical distributions; Temperature; Testing; Weibull distribution;

English

ieee

Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International

0-7803-8803-8

conf

10.1109/RELPHY.2005.1493203

1493203