DocumentCode :
1654230
Title :
Cancer radiotherapy equipment as a cause of soft-errors in electronic equipment
Author :
Wilkinson, J.D. ; Bounds, C. ; Brown, T. ; Gerbi, B. ; Peltier, J.
Author_Institution :
Medtronic Inc., Minneapolis, MN, USA
fYear :
2005
Firstpage :
692
Lastpage :
693
Keywords :
boron compounds; dielectric thin films; integrated circuit reliability; linear accelerators; neutron capture therapy; neutron effects; 10B(n, a)7Li reaction; B2O3-P2O5-SiO2; BPSG; IC dielectric materials; cancer radiotherapy linear accelerators; electronic equipment soft-errors; oncology; secondary neutron production; thermal neutrons; Building materials; Cancer; Electron beams; Electronic equipment; Linear accelerators; Monitoring; Neoplasms; Neutrons; Production; Structural beams;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International
Print_ISBN :
0-7803-8803-8
Type :
conf
DOI :
10.1109/RELPHY.2005.1493208
Filename :
1493208
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1654230
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