DocumentCode :
1654324
Title :
Unfolding procedure for SER measurements using quasi monoenergetic neutrons
Author :
Olmos, Marcos ; Prokofiev, Alexander ; Gaillard, Rémi
Author_Institution :
iRoC Technol., Grenoble, France
fYear :
2005
Firstpage :
696
Lastpage :
697
Keywords :
neutron effects; neutron sources; semiconductor device reliability; semiconductor device testing; SER measurement unfolding algorithm; SEU; atmospheric-like spectrum neutron sources; neutron spectrum low-energy tail correction; neutron-induced soft errors; quasi-monoenergetic neutrons; semiconductor device reliability; Atmospheric measurements; Cascading style sheets; Energy measurement; Error analysis; Error correction; Neutrons; Single event upset; Tail; Testing; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International
Print_ISBN :
0-7803-8803-8
Type :
conf
DOI :
10.1109/RELPHY.2005.1493210
Filename :
1493210
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1654324
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