• DocumentCode
    1654440
  • Title

    Simulation Of an Integrated Design and Test Environment For Mixed Signal Integrated Circuits

  • Author

    Bateman, Stephen C. ; Kao, William H.

  • fYear
    1992
  • Firstpage
    405
  • Keywords
    Automatic test equipment; Automatic testing; Circuit testing; Costs; Design engineering; Integrated circuit testing; Mixed analog digital integrated circuits; Performance evaluation; Signal design; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527850
  • Filename
    527850
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1654440