Title :
Stroboscopic X-ray topography of quartz resonators
Author :
Zarka, A. ; Capelle, B. ; Zheng, Y. ; Detaint, J. ; Schwartzel, J.
Author_Institution :
Lab. de Mineralogie-Cristallographie, Univ. Pierre et Marie Curie, Paris, France
Abstract :
Stroboscopic X-ray topography of 1-ns time resolution with synchrotron radiation has been used to study the vibrations in quartz resonators. Time-resolved images of the vibration reveal the existence of particular modes which cannot be observed on time-integrated images by conventional methods. A theoretical calculation is carried out to characterize pendellosung fringes on stroboscopic X-ray section topographs in weakly vibrating crystals. The agreement between the theoretical simulations and the experimental results demonstrates that for low vibration amplitudes (μ0⩽7 Å), pendellosung fringes can be related to vibration amplitudes. Stroboscopic X-ray traverse topographs are also discussed. All these examples show that the technique of stroboscopic X-ray topography is very useful for the study of vibrations in resonators
Keywords :
X-ray applications; crystal resonators; quartz; stroboscopes; surface topography; vibration measurement; 1 ns; 7 A; SiO2 resonators; existence of particular modes; experimental results; low vibration amplitudes; pendellosung fringes; quartz resonators; stroboscopic X-ray section topographs; stroboscopic X-ray topography; stroboscopic X-ray traverse topographs; study of vibrations in resonators; synchrotron radiation; theoretical calculation; theoretical simulations; time resolution; time resolved images; weakly vibrating crystals; Acoustic beams; Acoustic pulses; Crystals; Diffraction; Frequency; Resonance; Storage rings; Surfaces; Synchrotron radiation; X-ray imaging;
Conference_Titel :
Frequency Control Symposium, 1988., Proceedings of the 42nd Annual
Conference_Location :
Baltimore, MD
DOI :
10.1109/FREQ.1988.27584