DocumentCode :
1654608
Title :
Voltage propagation method for 3-D power grid analysis
Author :
Zhang, Cheng ; Pavlidis, Vasilis F. ; De Micheli, Giovanni
Author_Institution :
Integrated Syst. Lab., EPFL, Lausanne, Switzerland
fYear :
2012
Firstpage :
844
Lastpage :
847
Abstract :
Power grid analysis is a challenging problem for modern integrated circuits. For 3-D systems fabricated using stacked tiers with TSVs, traditional power grid analysis methods for planar (2-D) circuits do not demonstrate the same performance. An efficient IR drop analysis method for 3-D large-scale circuits, called 3-D voltage propagation method, is proposed in this paper. This method is compared with another widely used power grid analysis method, with preconditioned conjugated gradients. Simulation results demonstrate that the proposed method is more efficient for the IR drop analysis of large size 3-D power grids. Speedups between 10× to 20× over the preconditioned conjugated gradients method are shown.
Keywords :
three-dimensional integrated circuits; 2D circuits; 3D large-scale circuits; 3D power grid analysis method; 3D voltage propagation method; IR drop analysis; IR drop analysis method; planar circuits; preconditioned conjugated gradients; Algorithm design and analysis; Benchmark testing; Convergence; Integrated circuit modeling; Power grids; Resistance; Through-silicon vias; 3-D integrated circuits; Power grid analysis; Through-silicon vias;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
Conference_Location :
Dresden
ISSN :
1530-1591
Print_ISBN :
978-1-4577-2145-8
Type :
conf
DOI :
10.1109/DATE.2012.6176613
Filename :
6176613
Link To Document :
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