Title :
Narrow line-width photoluminescence spectrum of GaAs nanodisks fabricated using bio-template ultimate top-down processes
Author :
Tamura, Yoshinobu ; Higo, Akio ; Kiba, Takayuki ; Thomas, Cedric ; Yunpeng, Wang ; Sodabanlu, Hassanet ; Yamashita, Ichiro ; Sugiyama, Masakazu ; Nakano, Yoshiaki ; Murayama, Akihiro ; Samukawa, Seiji
Author_Institution :
Inst. of Fluid Sci., Tohoku Univ., Sendai, Japan
Abstract :
Quantum dot optoelectronic devices are very attractive for their low power consumption, temperature stability, and high-speed modulation. We developed an ultimate defect-free, top-down fabrication process for sub-20-nm diameter GaAs quantum nanodisks (NDs) by using a combination of a bio-template and neutral beam etching. Metal-organic vapor phase epitaxy was used to make stacked layers of GaAs/AlGaAs multiple quantum wells for etching and for regrowth of AlGaAs barrier layer after nanopillar fabrication (embedding GaAs NDs). To fabricate high-uniformity GaAs NDs array, surface condition such as oxide layer is very critical to etch GaAs/AlGaAs stacked layers with neutral beam. To make high quality GaAs NDs a small amount of oxide is better. To decrease the surface oxide ratio, we investigated oxygen processes such as oxygen radical treatment or low-temperature oxygen annealing under vacuum to remove ferritin protein shell. As a result, we could mitigate the surface oxide formation and achieved a high-uniformity and high-density GaAs NDs array. Very narrow line-width photo emission full-width at half maximum of less than 30 meV) was observed from NDs at 7 K confirming the high quality of GaAs NDs.
Keywords :
III-V semiconductors; aluminium compounds; annealing; chemical beam epitaxial growth; etching; gallium arsenide; low-power electronics; nanoelectronics; nanofabrication; optoelectronic devices; photoluminescence; power consumption; semiconductor quantum dots; semiconductor quantum wells; GaAs-AlGaAs; barrier layer regrowth; bio-template; ferritin protein shell removal; high-speed modulation; high-uniformity NDs array; low power consumption; low-temperature oxygen annealing; metal-organic vapor phase epitaxy; multiple quantum wells; nanopillar fabrication; narrow line-width photo emission full-width; narrow line-width photoluminescence spectrum; neutral beam; neutral beam etching; oxide layer; oxygen radical treatment; quantum dot optoelectronic devices; quantum nanodisks; stacked layers; surface condition; surface oxide ratio; temperature 7 K; temperature stability; ultimate defect-free top-down fabrication process; Epitaxial growth; Epitaxial layers; Etching; Gallium arsenide; Hydrogen; Proteins;
Conference_Titel :
Nanotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on
Conference_Location :
Toronto, ON
DOI :
10.1109/NANO.2014.6967977