• DocumentCode
    1654639
  • Title

    Manufacturing-oriented testing of delay faults in the logic architecture of symmetrical FPGAs

  • Author

    Girard, Patrick ; Héron, Olivier ; Pravossoudovitch, Serge ; Renovell, Michel

  • Author_Institution
    Universite Montpellier II
  • fYear
    2004
  • Firstpage
    52
  • Lastpage
    57
  • Keywords
    Circuit faults; Circuit testing; Delay; Fault detection; Field programmable gate arrays; Hardware; Logic testing; Manufacturing; Reconfigurable logic; Table lookup;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
  • Print_ISBN
    0-7695-2119-3
  • Type

    conf

  • DOI
    10.1109/ETSYM.2004.1347602
  • Filename
    1347602
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1654639