DocumentCode :
165464
Title :
Silver nanowires effect on photoluminescence of ZnO films deposited on different substrates with graphene oxide paper
Author :
Jijun Ding ; Minqiang Wang ; Xiangyu Zhang ; Chenxin Ran ; Zhi Yang
Author_Institution :
Electron. Mater. Res. Lab. (EMRL), Xi´an Jiaotong Univ., Xi´an, China
fYear :
2014
fDate :
18-21 Aug. 2014
Firstpage :
329
Lastpage :
332
Abstract :
Graphene oxide (GO) paper and Ag nanowires/GO compound (Ag NWs/GO) paper are fabricated by vacuum filtration method, and then ZnO films are deposited on GO paper and Ag NWs/GO paper, respectively, using magnetron sputtering. Morphology, crystal structure, and optical properties are analyzed. X-ray diffraction (XRD) results indicate that the residual tensile stress in ZnO on the Ag NWs/GO paper decrease, which is ascribed to the compressive stress in Ag NWs compensates the residual tensile stress due to lattice displace between ZnO and GO paper. The PL spectrum of ZnO film deposited on GO paper clearly shows a broad blue emission peak at 450 nm. Interestingly, PL from ZnO film on Ag NWs/GO paper not only the blue band is completely quenched but also shows a new ultraviolet (UV) peak at 396 nm compared to that of ZnO on GO paper. In addition, the Ag NWs/GO paper is irradiated 40 min by UV light, and then ZnO are deposited on the Ag NWs/GO paper. The intensity of UV peak at 396 nm increased compared to that of ZnO on the as prepared Ag NWs/GO paper. We proposed that Ag NWs acting as an electron acceptor can effectively modulate defect related emissions in ZnO by forming the depletion layer between the ZnO and GO interfaces.
Keywords :
II-VI semiconductors; X-ray diffraction; carbon compounds; compressive strength; crystal structure; interface structure; nanowires; photoluminescence; radiation quenching; silver; sputter deposition; surface morphology; tensile strength; ultraviolet radiation effects; wide band gap semiconductors; zinc compounds; Ag nanowires-GO compound paper; Ag-CO; CO; UV light irradiation; UV peak intensity; X-ray diffraction; XRD; ZnO films; ZnO-Ag-CO; ZnO-CO; ZnO-GO interface; broad blue emission peak; compressive stress; crystal structure; defect related emissions; depletion layer; electron acceptor; graphene oxide paper; lattice displacement; magnetron sputtering; morphology; photoluminescence; quenching; residual tensile stress; silver nanowires; substrates; time 40 min; ultraviolet peak; vacuum filtration method; Graphene; Optical films; Scanning electron microscopy; Sputtering; X-ray scattering; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on
Conference_Location :
Toronto, ON
Type :
conf
DOI :
10.1109/NANO.2014.6967979
Filename :
6967979
Link To Document :
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