Title :
A STEADY-STATE RESPONSE TEST GENERATION FOR MIXED-SIGNAL INTEGRATED CIRCUITS
Author :
Alani, Alaa F. ; Musgrave, G. ; Ambler, A.P.
Keywords :
Analog-digital conversion; Circuit testing; Design for testability; Integrated circuit testing; Logic testing; Mixed analog digital integrated circuits; Multiplexing; Signal generators; Steady-state; Test pattern generators;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527851
