• DocumentCode
    1654790
  • Title

    High-performance negative electron affinity photocathodes for high resolution electron beam lithography and metrology

  • Author

    Baum, A.W. ; Schneider, J.E. ; Pease, R.F.W.

  • Author_Institution
    Solid State Electron. Lab., Stanford Univ., CA, USA
  • fYear
    1995
  • Firstpage
    409
  • Lastpage
    412
  • Abstract
    Factors affecting the brightness of negative electron affinity photocathodes have been investigated experimentally and theoretically. The results of a two-dimensional model of electron dynamics in the cathode, including the effects of surface-trapped electrons, are presented. Emission is seen to be cut off in the central emission area at high current levels. The angular distribution is compared to a cosine distribution based on an energy spectrum obtained from the same cathode. While superior to the cosine distribution with respect to its forward focusing properties, it is far wider than previous theory has suggested
  • Keywords
    brightness; electron affinity; electron beam lithography; photocathodes; angular distribution; brightness; cosine distribution; electron beam lithography; electron dynamics; energy spectrum; focusing; high resolution metrology; negative electron affinity photocathodes; surface-trapped electrons; two-dimensional model; Brightness; Cathodes; Current density; Electron beams; Electron emission; Electron traps; Elementary particle vacuum; Gallium arsenide; Infrared detectors; Laser beams;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1995. IEDM '95., International
  • Conference_Location
    Washington, DC
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-2700-4
  • Type

    conf

  • DOI
    10.1109/IEDM.1995.499226
  • Filename
    499226