Title :
Evaluation of structures in C18TCNQ Langmuir-Blodgett ultrathin films with and without adsorbed donors using attenuated total reflection method
Author :
Kato, Keizo ; Ohashi, Kenichi ; Aoki, Yusuke ; Shinbo, Kazunari ; Kaneko, Futao ; Kobayashi, Satoshi
Author_Institution :
Graduate Sch. of Sci. & Technol., Niigata Univ., Japan
Abstract :
The structures are investigated using attenuated total reflection (ATR) for octadecyl-7,7´,8,8´-tetracyano-quinodimethane (C18TCNQ) Langmuir-Blodgett (LB) ultrathin films with and without adsorbed electronic donors of p-phenylenediamine (PD) and N,N,N´,N´-tetramethyl-p-phenylenediamine (TMPD). The thickness of the LB films is determined by theoretical curve fitting to the ATR curves assuming the dielectric constant of the LB films. The obtained thickness of the LB films without adsorbed donors is much larger than the molecular length of C18TCNQ. This is thought to be caused by the formation of bimolecular layers in the LB films. In contrast, LB films with adsorbed donors have monomolecular layered structure
Keywords :
Langmuir-Blodgett films; dielectric thin films; organic compounds; reflectivity; visible spectra; C18TCNQ; LB film thickness; Langmuir-Blodgett ultrathin films; N,N,N´,N´-tetramethyl-p-phenylenediamine; adsorbed donors; attenuated total reflection; bimolecular layers; curve fitting; dielectric constant; molecular length; monomolecular layered structure; octadecyl-7,7´,8,8´-tetracyano-quinodimethane; p-phenylenediamine; structure evaluation; visible absorption spectra; Chemical lasers; Conductive films; Dielectric constant; Glass; Laser beams; Optical films; Optical surface waves; Reflection; Substrates; Thermal conductivity;
Conference_Titel :
Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
Conference_Location :
Seoul
Print_ISBN :
0-7803-2651-2
DOI :
10.1109/ICPADM.1997.617662
