• DocumentCode
    165483
  • Title

    Photoemission properties of LaB6 thin films for the use in PIDs

  • Author

    Zimmer, Cordula M. ; Yoganathan, K. ; Giebel, F.J. ; Lutzenkirchen-Hecht, D. ; Glosekotter, P. ; Kallis, K.T.

  • Author_Institution
    Inst. of Intell. Microsyst., Tech. Univ. of Dortmund, Dortmund, Germany
  • fYear
    2014
  • fDate
    18-21 Aug. 2014
  • Firstpage
    877
  • Lastpage
    881
  • Abstract
    For the improvement of a commercially available photo ionization detector (PID) with respect to its gas selectivity and sensitivity, a thin emitter film (≈ 20nm) of lanthanum hexaboride (LaB6) was integrated performing the gas detection by photo emitted electrons. To confirm the chosen emitter material´s suitability as a photocathode, analyses were performed by X-ray diffraction (XRD) and ultraviolet photoelectron spectroscopy (UPS). Hereby, thin LaB6 films sputtered with higher argon flow rate and sputtering power produced a (100)-oriented film texture yielding work functions in the range of 3.42 to 4.05 eV, accordingly. Photoemission measurements were also realized, whereby quantum efficiency (QE) of thin LaB6 films is still too low compared to laser driven photocathodes when excited by 4.5 eV photons.
  • Keywords
    X-ray diffraction; gas sensors; lanthanum compounds; photocathodes; photoemission; photoionisation; sputter deposition; texture; thin film sensors; thin films; ultraviolet photoelectron spectra; work function; (100)-oriented film texture; LaB6; PID; UPS; X-ray diffraction; XRD; argon flow rate; electron volt energy 4.5 eV; gas detection; gas selectivity; gas sensitivity; lanthanum hexaboride thin films; photocathode; photoemission measurements; photoemission properties; photoemitted electrons; photoionization detectors; quantum efficiency; sputtering power; thin emitter film; ultraviolet photoelectron spectroscopy; work functions; Anodes; Argon; Cathodes; Current measurement; Lighting; Photonics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on
  • Conference_Location
    Toronto, ON
  • Type

    conf

  • DOI
    10.1109/NANO.2014.6967988
  • Filename
    6967988