• DocumentCode
    1654944
  • Title

    User-constrained test architecture design for modular SOC testing

  • Author

    Krundel, Ludovic ; Goel, Sandeep Kumar ; Marinissen, Erik Jan ; Flottes, Marie-Lise ; Rouzeyre, Bruno

  • Author_Institution
    Philips Research Laboratories
  • fYear
    2004
  • Firstpage
    80
  • Lastpage
    85
  • Keywords
    Automatic testing; Computer architecture; Constraint optimization; Cost function; Design optimization; Digital integrated circuits; Integrated circuit testing; Laboratories; Minimization methods; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
  • Print_ISBN
    0-7695-2119-3
  • Type

    conf

  • DOI
    10.1109/ETSYM.2004.1347611
  • Filename
    1347611
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1654944