DocumentCode :
1654998
Title :
Efficient Gröbner basis reductions for formal verification of galois field multipliers
Author :
Lv, Jinpeng ; Kalla, Priyank ; Enescu, Florian
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Utah, Salt Lake City, UT, USA
fYear :
2012
Firstpage :
899
Lastpage :
904
Abstract :
Galois field arithmetic finds application in many areas, such as cryptography, error correction codes, signal processing, etc. Multiplication lies at the core of most Galois field computations. This paper addresses the problem of formal verification of hardware implementations of (modulo) multipliers over Galois fields of the type F(2k), using a computer-algebra/algebraic-geometry based approach. The multiplier circuit is modeled as a polynomial system in F(2k)[x1, x2, ... , xd] and the verification problem is formulated as a membership test in a corresponding (radical) ideal. This requires the computation of a Gröbner basis, which can be computationally intensive. To overcome this limitation, we analyze the circuit topology and derive a term order to represent the polynomials. Subsequently, using the theory of Gröbner bases over Galois fields, we prove that this term order renders the set of polynomials itself a Gröbner basis of this ideal - thus significantly improving verification. Using our approach, we can verify the correctness of, and detect bugs in, upto 163-bit circuits in F(2163); whereas contemporary approaches are infeasible.
Keywords :
Galois fields; digital arithmetic; formal verification; multiplying circuits; network topology; polynomials; process algebra; 163-bit circuits; Galois field arithmetic; Galois field multiplier; Grobner basis reductions; algebraic geometry-based approach; bug detection; circuit topology; computer algebra-based approach; formal verification; multiplier circuit modeling; multiplier hardware implementation; polynomial system; Boolean functions; Computer bugs; Data structures; Elliptic curve cryptography; Integrated circuit modeling; Logic gates; Polynomials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
Conference_Location :
Dresden
ISSN :
1530-1591
Print_ISBN :
978-1-4577-2145-8
Type :
conf
DOI :
10.1109/DATE.2012.6176625
Filename :
6176625
Link To Document :
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