• DocumentCode
    1655041
  • Title

    Review and classification of reliability statistical models exhibiting failure-free life characteristic

  • Author

    Halim, Tony ; Muthusamy, Kanesan ; Lam, Shao-Wei ; Chia, Sie-Yong

  • Author_Institution
    Dept. of Bus. Process & Syst. Eng., Temasek Polytech., Singapore, Singapore
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In many real-world reliability engineering applications, basic engineering considerations typically result in the need for using a statistical distribution with a failure free life (FFL) parameter. These include the usual failure time models as well as specialized repair time models for maintenance planning, and breakdown voltage models used for voltage endurance studies of electrical insulations. In the domain of quality and reliability engineering, literature in the area of FFL is relatively sparse. In this paper, we proposed a classification structure for the purpose of defining the type of distributions based on considerations of the failure mechanism and distributional structure. From the literature, the three-parameter Weibull distribution has been found to be the most common statistical distribution used when failure free life is considered. Some estimation procedures for the three-parameter Weibull distribution are discussed and a new modified maximum likelihood type approach which leverages on the empirical cumulative distribution function is proposed for subsequent research in this paper.
  • Keywords
    Weibull distribution; failure analysis; maintenance engineering; maximum likelihood estimation; reliability theory; breakdown voltage models; classification structure; failure-free life characteristic; maintenance planning; modified maximum likelihood type approach; reliability statistical models; three-parameter Weibull distribution; Fatigue; Maintenance engineering; Maximum likelihood estimation; Reliability engineering; Weibull distribution; Failure-free life; maintenance; maximum likelihood estimation; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computers and Industrial Engineering (CIE), 2010 40th International Conference on
  • Conference_Location
    Awaji
  • Print_ISBN
    978-1-4244-7295-6
  • Type

    conf

  • DOI
    10.1109/ICCIE.2010.5668387
  • Filename
    5668387