DocumentCode
1655053
Title
Closed-form error exponent for the Neyman-Pearson fusion of Markov local decisions
Author
Plata-Chaves, Jorge ; Lázaro, Marcelino
Author_Institution
Dept. of Signal Theor. & Commun., Univ. Carlos III de Madrid, Leganes, Spain
fYear
2009
Firstpage
533
Lastpage
536
Abstract
In this correspondence, we derive a closed-form expression of the error exponent associated with the binary Neyman-Pearson test performed at the fusion center of a distributed detection system where a large number of local detectors take dependent binary decisions regarding a specific phenomenon. We assume that the sensors are equally spaced along a straight line, that their local decisions are taken with no kind of cooperation, and that they are transmitted to the fusion center over an error free parallel access channel. Under each one of the two possible hypothesis, H0 and H1 the correlation structure of the local binary decisions is modelled with a first-order binary Markov chain whose transition probabilities are linked with different physical parameters of the network. Through different simulations based on the error exponent and a deterministic physical model of the aforementioned transition probabilities we study the effect of network density on the overall detection performance.
Keywords
Markov processes; correlation methods; decision theory; probability; sensor fusion; wireless sensor networks; Markov local decision; Neyman-Pearson fusion; closed-form error exponent; correlation structure; distributed detection system; first-order binary Markov chain; parallel access channel; transition probability; wireless sensor network; AWGN; Additive white noise; Closed-form solution; Detectors; Event detection; Performance evaluation; Sensor fusion; Sensor phenomena and characterization; System testing; Wireless sensor networks; Neyman-Pearson distributed detection; dependent local decisions; error exponent; wireless sensor networks;
fLanguage
English
Publisher
ieee
Conference_Titel
Statistical Signal Processing, 2009. SSP '09. IEEE/SP 15th Workshop on
Conference_Location
Cardiff
Print_ISBN
978-1-4244-2709-3
Electronic_ISBN
978-1-4244-2711-6
Type
conf
DOI
10.1109/SSP.2009.5278522
Filename
5278522
Link To Document