DocumentCode
1655079
Title
A compression-driven test access mechanism design approach
Author
Gonciari, Paul Theo ; Al-Hashimi, Bashir M.
Author_Institution
University of Southampton
fYear
2004
Firstpage
100
Lastpage
105
Keywords
Automatic testing; Costs; Decoding; Design methodology; Electronics industry; Manufacturing automation; Semiconductor device testing; System testing; System-on-a-chip; Test data compression;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
Print_ISBN
0-7695-2119-3
Type
conf
DOI
10.1109/ETSYM.2004.1347617
Filename
1347617
Link To Document