Title :
A compression-driven test access mechanism design approach
Author :
Gonciari, Paul Theo ; Al-Hashimi, Bashir M.
Author_Institution :
University of Southampton
Keywords :
Automatic testing; Costs; Decoding; Design methodology; Electronics industry; Manufacturing automation; Semiconductor device testing; System testing; System-on-a-chip; Test data compression;
Conference_Titel :
Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
Print_ISBN :
0-7695-2119-3
DOI :
10.1109/ETSYM.2004.1347617
