DocumentCode
1655234
Title
Post-deployment trust evaluation in wireless cryptographic ICs
Author
Jin, Yier ; Maliuk, Dzmitry ; Makris, Yiorgos
Author_Institution
Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
fYear
2012
Firstpage
965
Lastpage
970
Abstract
The use of side-channel parametric measurements along with statistical analysis methods for detecting hardware Trojans in fabricated integrated circuits has been studied extensively in recent years, initially for digital designs but recently also for their analog/RF counterparts. Such post-fabrication trust evaluation methods, however, are unable to detect dormant hardware Trojans which are activated after a circuit is deployed in its field of operation. For the latter, an on-chip trust evaluation method is required. To this end, we present a general architecture for post-deployment trust evaluation based on on-chip classifiers. Specifically, we discuss the design of an on-chip analog neural network which can be trained to distinguish trusted from untrusted circuit functionality based on simple measurements obtained via on-chip measurement acquisition sensors. The proposed method is demonstrated using a Trojan-free and two Trojan infested variants of a wireless cryptographic IC design, as well as a fabricated programmable neural network experimentation chip. As corroborated by the obtained experimental results, two current measurements suffice for the on-chip classifier to effectively assess trustworthiness and, thereby, detect hardware Trojans that are activated after chip deployment.
Keywords
cryptography; integrated circuit design; neural chips; radiofrequency integrated circuits; statistical analysis; digital designs; hardware Trojan detection; integrated circuits; on-chip analog neural network design; on-chip classifiers; on-chip measurement acquisition sensors; on-chip trust evaluation method; post-deployment trust evaluation; post-fabrication trust evaluation methods; side-channel parametric measurements; statistical analysis methods; untrusted circuit functionality; wireless cryptographic IC design; Biological neural networks; Current measurement; Hardware; Semiconductor device measurement; Sensors; System-on-a-chip; Trojan horses;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4577-2145-8
Type
conf
DOI
10.1109/DATE.2012.6176636
Filename
6176636
Link To Document