Title :
A new BIST scheme for 5GHz low noise amplifiers
Author :
Ryu, Jee-Youl ; Kim, Bruce C. ; Sylla, Iboun
Author_Institution :
Arizona State University
Keywords :
Built-in self-test; Circuit faults; Circuit testing; Costs; Low-noise amplifiers; Noise figure; Noise measurement; Radio frequency; Radiofrequency integrated circuits; Semiconductor device measurement;
Conference_Titel :
Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
Print_ISBN :
0-7695-2119-3
DOI :
10.1109/ETSYM.2004.1347625
