• DocumentCode
    165527
  • Title

    Fabrication and characterization of silicon micromirror with carbon nanotubes-nickel nanocomposite beams

  • Author

    Zhonglie An ; Toda, Masayoshi ; Yamamoto, Go ; Hashida, Toshiyuki ; Ono, Takahito

  • Author_Institution
    Grad. Sch. of Eng., Tohoku Univ., Sendai, Japan
  • fYear
    2014
  • fDate
    18-21 Aug. 2014
  • Firstpage
    888
  • Lastpage
    892
  • Abstract
    In this paper, we present the fabrication and characterization of a silicon micromirror with carbon nanotubes (CNTs)-nickel (Ni) nanocomposite beams, and evaluate the mechanical stability of the micromirror in terms of resonant frequency. A novel electroplating method is developed for synthesis of the CNTs-Ni nanocomposite. CNTs are pretreated to have positive charges on their surface and added into a Ni electroplating solution to form a CNTs-Ni nanocomposite electroplating suspension. The weight fraction of the CNT in the electroplated nanocomposite is 9.1 wt%, and the ultramicroindentation hardness is 13 GPa. The mechanical strengthening improvement is found in the nanocomposite in comparison with a Ni film. The maximum variation of the resonant frequency of the micromirror during a long term stability test is about 0.4%, and its scanning angle is about 11°. It shows the potential ability of the CNTs-Ni nanocomposite with proper design for microstructure application.
  • Keywords
    carbon nanotubes; electroplating; elemental semiconductors; hardness; indentation; mechanical stability; micromirrors; nanocomposites; nanophotonics; nickel; optical fabrication; silicon; C; Ni; carbon nanotubes-nickel nanocomposite beams; mechanical stability; mechanical strengthening; nanocomposite electroplating suspension; silicon micromirror; stability test; ultramicroindentation hardness; weight fraction; Laser beams; Measurement by laser beam; Micromirrors; Nickel; Resonant frequency; Silicon; Surface morphology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on
  • Conference_Location
    Toronto, ON
  • Type

    conf

  • DOI
    10.1109/NANO.2014.6968008
  • Filename
    6968008