Title :
MAPG: Memory access power gating
Author :
Jeong, Kwangok ; Kahng, Andrew B. ; Kang, Seokhyeong ; Rosing, Tajana S. ; Strong, Richard
Author_Institution :
Dept. of Electr. & Comput. Eng., UC San Diego, La Jolla, CA, USA
Abstract :
In mobile systems, the problems of short battery life and increased temperature are exacerbated by wasted leakage power. Leakage power waste can be reduced by power-gating a core while it is stalled waiting for a resource. In this work, we propose and model memory access power gating (MAPG), a low-overhead technique to enable power gating of an active core when it stalls during a long memory access. We describe a programmable two-stage power gating switch design that can vary a core´s wake-up delay while maintaining voltage noise limits and leakage power savings. We also model the processor power distribution network and the effect of memory access power gating on neighboring cores. Last, we apply our power gating technique to actual benchmarks, and examine energy savings and overheads from power gating stalled cores during long memory accesses. Our analyses show the potential for over 38% energy savings given “perfect” power gating on memory accesses; we achieve energy savings exceeding 20% for a practical, counter-based implementation.
Keywords :
SRAM chips; cores; delays; electrical faults; multiprocessing systems; MAPG; active core wake-up delay; leakage power saving; low-overhead technique; memory access power gating; multicore processor; power gating overhead; processor power distribution network; programmable two-stage power gating switch design; voltage noise limit; Clocks; Radiation detectors;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
Conference_Location :
Dresden
Print_ISBN :
978-1-4577-2145-8
DOI :
10.1109/DATE.2012.6176651