• DocumentCode
    165568
  • Title

    Bit erasure analysis of binary adders in Quantum-dot Cellular Automata

  • Author

    McLarnon, Emma ; O´Neill, Maire ; Weiqiang Liu ; Hanninen, Ismo

  • Author_Institution
    Inst. of Electron., Commun. & Inf. Technol., Queen´s Univ. of Belfast, Belfast, UK
  • fYear
    2014
  • fDate
    18-21 Aug. 2014
  • Firstpage
    296
  • Lastpage
    301
  • Abstract
    As a post-CMOS technology, the incipient Quantum-dot Cellular Automata technology has various advantages. A key aspect which makes it highly desirable is low power dissipation. One method that is used to analyse power dissipation in QCA circuits is bit erasure analysis. This method has been applied to analyse previously proposed QCA binary adders. However, a number of improved QCA adders have been proposed more recently that have only been evaluated in terms of area and speed. As the three key performance metrics for QCA circuits are speed, area and power, in this paper, a bit erasure analysis of these adders will be presented to determine their power dissipation. The adders to be analysed are the Carry Flow Adder (CFA), Brent-Kung Adder (B-K), Ladner-Fischer Adder (L-F) and a more recently developed area-delay efficient adder. This research will allow for a more comprehensive comparison between the different QCA adder proposals. To the best of the authors´ knowledge, this is the first time power dissipation analysis has been carried out on these adders.
  • Keywords
    CMOS digital integrated circuits; adders; cellular automata; quantum dots; B-K; Brent-Kung adder; CFA; L-F; Ladner-Fischer adder; QCA circuits; binary adders; bit erasure analysis; carry flow adder; low power dissipation; performance metrics; post-CMOS technology; quantum-dot cellular automata technology; Adders; Delays; Logic gates; Power dissipation; Quantum dots; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on
  • Conference_Location
    Toronto, ON
  • Type

    conf

  • DOI
    10.1109/NANO.2014.6968030
  • Filename
    6968030