Title :
Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution
Author :
Dilillo, Luigi ; Girard, Patrick ; Pravossoudovitch, Serge ; Virazel, Arnaud ; Borri, Simone ; Hage-Hassan, Magali
Author_Institution :
Universite de Montpellier II
Keywords :
Change detection algorithms; Circuit faults; Fault detection; Random access memory; Robots; Silicon; Stress; System-on-a-chip; Testing; Uniform resource locators;
Conference_Titel :
Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
Print_ISBN :
0-7695-2119-3
DOI :
10.1109/ETSYM.2004.1347645
