Title :
Tests for address decoder delay faults in RAMs due to inter-gate opens
Author :
Van de Goor, Ad J. ; Hamdioui, Said ; Al-Ars, Zaid
Author_Institution :
Delft University of Technology
Keywords :
Added delay; Circuit faults; Circuit testing; Decoding; Fault detection; Laboratories; Read-write memory; Research and development; Space exploration; Space technology;
Conference_Titel :
Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
Print_ISBN :
0-7695-2119-3
DOI :
10.1109/ETSYM.2004.1347646
