DocumentCode
1655734
Title
Tests for address decoder delay faults in RAMs due to inter-gate opens
Author
Van de Goor, Ad J. ; Hamdioui, Said ; Al-Ars, Zaid
Author_Institution
Delft University of Technology
fYear
2004
Firstpage
146
Lastpage
151
Keywords
Added delay; Circuit faults; Circuit testing; Decoding; Fault detection; Laboratories; Read-write memory; Research and development; Space exploration; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
Print_ISBN
0-7695-2119-3
Type
conf
DOI
10.1109/ETSYM.2004.1347646
Filename
1347646
Link To Document