DocumentCode
1655790
Title
Functional fault coverage: the chamber of secrets or an accurate estimation of gate-level coverage?
Author
Fummi, Franco ; Marconcini, Cristina ; Pravadelli, Graziano
Author_Institution
Universita di Verona
fYear
2004
Firstpage
154
Lastpage
159
Keywords
Analytical models; Automatic test pattern generation; Digital systems; Electronic design automation and methodology; Fault detection; Pattern analysis; Performance analysis; Test pattern generators; Testing; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
Print_ISBN
0-7695-2119-3
Type
conf
DOI
10.1109/ETSYM.2004.1347649
Filename
1347649
Link To Document