Title :
Automatic test pattern generation for resistive bridging faults
Author :
Engelke, Piet ; Polian, Ilia ; Renovell, Michel ; Becker, Bernd
Author_Institution :
Albert-Ludwigs-University
Keywords :
Automatic test pattern generation; Bridge circuits; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Logic gates; Logic testing; Threshold voltage;
Conference_Titel :
Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
Print_ISBN :
0-7695-2119-3
DOI :
10.1109/ETSYM.2004.1347652
