Title :
Measuring the sphere-surface interaction in optical trap assisted nanopatterning
Author :
Fardel, R. ; Tsai, Y. ; Arnold, Craig B.
Author_Institution :
Dept. of Mech. & Aerosp. Eng., Princeton Univ., Princeton, NJ, USA
Abstract :
Near-field methods rely on a precise positioning of the optical element above the surface. In this work, we measure the interaction potential of a trapped microsphere near a sample surface by high-speed microscopy.
Keywords :
micro-optics; nanopatterning; nanophotonics; optical microscopy; radiation pressure; high-speed microscopy; near-field methods; optical element; optical trap assisted nanopatterning; sample surface; sphere-surface interaction potential; trapped microsphere; Charge carrier processes; High speed optical techniques; Optical diffraction; Optical feedback; Optical imaging; Optical pulses; Optical scattering;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1839-6
