Analysis of superconducting thin film using an approximate model of the current distribution

Author

Elkordy, M. ; Taha, T.E. ; Gomaa, A.

Author_Institution

Fac. of Electron. Eng., Menoufia Univ., Egypt

Volume

3

fYear

2001

fDate

6/23/1905 12:00:00 AM

Firstpage

1441

Abstract

In this paper, an approximate analytical method for calculating the surface impedance of superconducting thin film is presented. This method is based on Maxwell equations, vector identities, stoke theorem, Gauss theorem, differential operations in various coordinates and poynting theorem analysis for an approximate model of the current distribution in a superconductor thin film. The physical basis for the approximate analytical treatment leading to the calculation of the surface impedance is described. The mathematical details of the calculation are also given. The obtained results are presented in analytical and graphical form. The computer simulation results are verified by comparison with results using surface impedance formula based on the Mattis-Bardeen equations, which based on the Bardeen Cooper Schrieffer theory

Keywords

Maxwell equations; current distribution; electric impedance; superconducting thin films; Gauss theorem; Maxwell equations; approximate analytical method; current distribution; differential operations; poynting theorem analysis; stoke theorem; superconducting thin film; surface impedance; vector identities; Current distribution; Equations; Superconducting devices; Superconducting integrated circuits; Superconducting materials; Superconducting microwave devices; Superconducting thin films; Surface impedance; Surface resistance; Surface treatment;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Circuits and Systems, 2001. ICECS 2001. The 8th IEEE International Conference on

Print_ISBN

0-7803-7057-0

Type

conf

DOI

10.1109/ICECS.2001.957486

Filename

957486