DocumentCode :
1656405
Title :
High performance InAlAs/InGaAs/InP HEMT/MSM-based OEIC photoreceivers
Author :
Adesida, I. ; Fay, P. ; Wohlmuth, W. ; Caneau, C.
Author_Institution :
Center for Compound Semicond. Microelectron., Illinois Univ., Urbana, IL, USA
fYear :
1995
Firstpage :
579
Lastpage :
582
Abstract :
A high-speed, monolithically integrated photoreceiver suitable for 1.55 μm wavelength optical communication systems is described. The tunable photoreceiver, implemented using a metal-semiconductor-metal (MSM) photodetector and InAlAs/InGaAs/InP high electron mobility transistor (HEMT)-based transimpedance amplifier, exhibits -3 dB bandwidths of up to 17 GHz. Noise measurements revealed an input-referred noise current spectral density of 8 pA/Hz1/2 when tuned for 10 Gb/s operation, and 12 pA/Hz1/2 when tuned for 20 Gb/s operation. This results in a projected sensitivity of -16.5 dBm and -12.3 dBm at 10 and 20 Gb/s, respectively, for a bit error rate of 1×10-9
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; indium compounds; integrated optoelectronics; metal-semiconductor-metal structures; optical receivers; photodetectors; 1.55 micrometre; 10 Gbit/s; 17 GHz; 20 Gbit/s; HEMT/MSM-based OEIC; InAlAs-InGaAs-InP; bit error rate; input-referred noise current spectral density; noise measurements; optical communication systems; photodetector; projected sensitivity; transimpedance amplifier; tunable photoreceiver; Bandwidth; HEMTs; Indium compounds; Indium gallium arsenide; Indium phosphide; MODFETs; Optical amplifiers; Optical fiber communication; Optoelectronic devices; Photodetectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1995. IEDM '95., International
Conference_Location :
Washington, DC
ISSN :
0163-1918
Print_ISBN :
0-7803-2700-4
Type :
conf
DOI :
10.1109/IEDM.1995.499288
Filename :
499288
Link To Document :
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