DocumentCode :
1656490
Title :
Study of the damping processes in thickness shear mode resonator chemical sensors
Author :
Falconi, Christian ; Di Natale, Corrado ; D´Amico, D. ; Ferri, Giuseppe ; D´Amico, Arnaldo
Author_Institution :
Dipt. di Ingegneria Elettronica, Rome Univ., Italy
Volume :
3
fYear :
2001
fDate :
6/23/1905 12:00:00 AM
Firstpage :
1517
Abstract :
This work illustrates an alternative method of extracting signals from thickness shear mode resonator sensors. The basic idea consists of modulating the voltage supply of an oscillator circuit driven by a quartz element. The sensor signal can then be obtained measuring the time decay of the output signal in the off state, where some energy, stored in the on state, is released in the form of a damping oscillation. It has been experimentally proven that the time decay in the off state can be reproducibly related to the quartz loading by a remarkable sensitivity function. This paper shows most of the results obtained so far by this technique and discusses the general performance, advantages and disadvantages as well as comparison with the standard frequency measurement technique
Keywords :
chemical sensors; crystal oscillators; crystal resonators; quartz; SiO2; chemical sensors; damping oscillation; damping processes; quartz element driven oscillator circuit; quartz loading; signal extraction; thickness shear mode resonator sensors; time decay; transition phenomena; voltage supply modulation; Chemical sensors; Circuits; Coatings; Damping; Oscillators; Polymer films; Power supplies; Resonance; Resonant frequency; Slabs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems, 2001. ICECS 2001. The 8th IEEE International Conference on
Print_ISBN :
0-7803-7057-0
Type :
conf
DOI :
10.1109/ICECS.2001.957503
Filename :
957503
Link To Document :
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