• DocumentCode
    1656551
  • Title

    New convergence scheme for self-consistent electromechanical analysis of iMEMS

  • Author

    Bächtold, M. ; Korvink, J.G. ; Funk, J. ; Baltes, H.

  • Author_Institution
    Phys. Electron. Lab., Eidgenossische Tech. Hochschule, Zurich, Switzerland
  • fYear
    1995
  • Firstpage
    605
  • Lastpage
    608
  • Abstract
    The simulation of integrated micro-electromechanical structures (iMEMS) such as electrostatically driven microactuators often fails to converge due to the strong geometrical non-linearity of the electric potential. We present a new convergence scheme that uses a first-order approximation for the relation between the mechanical deformation and the electrostatic force derived from an electrostatic formulation using the boundary element method (BEM). The overall computational complexity per iteration is the same as with direct relaxation. A Newton update of the surface displacement solves otherwise divergent simulations and reduces the number of non-linear iterations for a self-consistent result. This allows efficient modelling of electromechanical actuators subject to strong deformations such as electrostatic comb-drives and deflectable micro-mirrors
  • Keywords
    Newton method; boundary-elements methods; convergence of numerical methods; electrostatic devices; microactuators; Newton update; boundary element method; computational complexity; convergence scheme; deflectable micro-mirrors; electromechanical actuators; electrostatic comb-drives; electrostatic force; first-order approximation; geometrical nonlinearity; iMEMS; integrated micro-electromechanical structures; mechanical deformation; microactuators; nonlinear iterations; self-consistent electromechanical analysis; surface displacement; Boundary conditions; Convergence; Deformable models; Dielectrics; Electrostatic analysis; Failure analysis; Iron; Jacobian matrices; Mechanical systems; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1995. IEDM '95., International
  • Conference_Location
    Washington, DC
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-2700-4
  • Type

    conf

  • DOI
    10.1109/IEDM.1995.499294
  • Filename
    499294