1656665

Analysis of Steady State Detection of Resistive Bridging Faults in BiCMOS Digital ICs

Favalli, Michele ; Dalpasso, Marcello ; Olivo, Piero ; Riccò, Bruno

1995

466

BiCMOS integrated circuits; CMOS logic circuits; CMOS technology; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Semiconductor device modeling; Steady-state;

English

ieee

Test Conference, 1992. Proceedings., International

Baltimore, MD

1089-3539

0-7803-0760-7

conf

10.1109/TEST.1992.527858

527858