1656876

Transistor Fault Coverage for Self-Testing CMOS Checkers

Liden, Peter ; Dahlgren, Peter ; Torin, Jan

1992

476

Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Computational modeling; Computer simulation; Electrical fault detection; Fault detection; Semiconductor device modeling; System testing;

English

ieee

Test Conference, 1992. Proceedings., International

1089-3539

0-7803-0760-7

conf

10.1109/TEST.1992.527859

527859