• DocumentCode
    1656914
  • Title

    Comparison of Self-Timed Ring and Inverter Ring Oscillators as entropy sources in FPGAs

  • Author

    Cherkaoui, Abdelkarim ; Fischer, Viktor ; Aubert, Alain ; Fesquet, Laurent

  • Author_Institution
    Hubert Curien Lab., St. Etienne, France
  • fYear
    2012
  • Firstpage
    1325
  • Lastpage
    1330
  • Abstract
    Many True Random Numbers Generators (TRNG) use jittery clocks generated in ring oscillators as a source of entropy. This is especially the case in Field Programmable Gate Arrays (FPGA), where sources of randomness are very limited. Inverter Ring Oscillators (IRO) are relatively well characterized as entropy sources. However, it is known that they are very sensitive to working conditions. This fact makes them vulnerable to attacks. On the other hand, Self-Timed Rings (STR) are currently considered as a promising solution to generate robust clock signals. Although many studies deal with their temporal behavior and robustness in Application Specific Integrated Circuits (ASIC), equivalent study does not exist for FPGAs. Furthermore, these oscillators were not analyzed and characterized as entropy sources aimed at TRNG design. In this paper, we analyze STRs as entropy sources for TRNGs implemented in FPGAs. Next, we compare STRs and IROs when serving as sources of randomness. We show that STRs represent very interesting alternative to IROs: they are more robust to environmental fluctuations and they exhibit lower extra-device frequency variations.
  • Keywords
    application specific integrated circuits; field programmable gate arrays; jitter; oscillators; random number generation; ASIC; FPGA; IRO; STR; TRNG; application specific integrated circuits; entropy sources; inverter ring oscillators; jittery clocks; self-timed ring; true random number generators; Field programmable gate arrays; Frequency measurement; Jitter; Oscillators; Propagation delay; Robustness; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4577-2145-8
  • Type

    conf

  • DOI
    10.1109/DATE.2012.6176697
  • Filename
    6176697