Title :
Integrated circuits immunity evaluation by different test procedures
Author_Institution :
Dipt. di Elettronica, Politecnico di Torino, Italy
fDate :
6/21/1905 12:00:00 AM
Abstract :
In this paper some methods to perform integrated circuit (IC) susceptibility tests are described. The Work Bench Faraday Cage method allows the measurements of small PCBs or ICs immunity to common mode conducted RF interference, while the direct injection method makes possible the evaluation of IC immunity to differential mode disturbance. The evaluation of ICs susceptibility to electromagnetic radiated field can be performed by the TEM cell method. Test benches related with methods summarized in this paper, were realized and used in order to verify experimentally the immunity of a microcontroller IC. In this work the different measurement procedures are compared and the test benches weak points are highlighted.
Keywords :
electromagnetic compatibility; electromagnetic fields; integrated circuit testing; microcontrollers; radiofrequency interference; test facilities; TEM cell method; Work Bench Faraday Cage method; common mode conducted RF interference; differential mode disturbance immunity; direct injection method; electromagnetic radiated field; integrated circuits immunity evaluation; microcontroller IC; susceptibility tests; test procedures; Circuit testing; Electromagnetic fields; Electromagnetic interference; Electromagnetic measurements; Electromagnetic radiation; Integrated circuit measurements; Integrated circuit testing; Performance evaluation; Radiofrequency integrated circuits; TEM cells;
Conference_Titel :
Computational Electromagnetics and Its Applications, 1999. Proceedings. (ICCEA '99) 1999 International Conference on
Print_ISBN :
0-7803-5802-3
DOI :
10.1109/ICCEA.1999.825127
