Title :
Parametric Bridging Fault Characterieation for the Fault Simulation of Library-Based ICs
Author :
Dalpasso, Marcello ; Favalli, Michele ; Olivo, Piero ; Riccó, Bruno
Keywords :
CMOS integrated circuits; CMOS logic circuits; Circuit faults; Circuit simulation; Fault detection; Integrated circuit synthesis; Libraries; Resistors; Semiconductor device modeling; Voltage;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527860
