Title :
Susceptibility testing using GTEM cell
Author :
Ghosh, S. ; Chakrabarty, A. ; Sanyal, S. ; Katti, V.R. ; Shastry, S.V.K.
Author_Institution :
Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol., Kharagpur, India
fDate :
6/24/1905 12:00:00 AM
Abstract :
The GTEM cell has been found as a suitable test environment for radiated susceptibility testing of electronic equipment. In Microwave Measurement Laboratory, Department of E & ECE, IIT Kharagpur, a GTEM cell with test volume 1 m 3 and characteristic impedance of 50 Ω has been fabricated and is being successfully used for radiated emission and susceptibility testing. For susceptibility testing the device is intentionally put in the required amount of electric field. In this paper a method of moment based procedure is described to evaluate the field produced inside the cell due to a certain amount of applied power. The theoretical value is in good agreement with the measured one.
Keywords :
electromagnetic compatibility; electromagnetic interference; electronic equipment testing; magnetic susceptibility; test facilities; testing; GTEM cell; IIT Kharagpur; Microwave Measurement Laboratory; electric field; electronic equipment; impedance; radiated emission testing; radiated susceptibility testing; Conductors; Electromagnetic compatibility; Electronic equipment; Electronic equipment testing; Integral equations; Microwave communication; Moment methods; Satellites; Strips; TEM cells;
Conference_Titel :
Electromagnetic Interference and Compatibility, 2001/02. Proceedings of the International Conference on
Print_ISBN :
0-7803-7563-7
DOI :
10.1109/ICEMIC.2002.1006518
