Title :
In-situ synchrotron X-ray diffraction measurement of epitaxial FeRh thin films
Author :
Jang, Sung-Uk ; Hyun, Seungmin ; Lee, Hwan Soo ; Kwon, Soon-Ju ; Kim, Ji-Hong ; Park, Ki-Hoon ; Lee, Hak-Joo
Author_Institution :
Dept. of Mater. Sci. & Eng., Pohang Univ. of Sci. & Technol., Pohang, South Korea
Abstract :
The magnetic properties and structure of FeRh thin film epitaxially grown onto MgO(001) substrate were studied by MPMS(Magnetic Properties Measure System) and in-situ temperature synchrotron XRD(X-ray Diffraction). The transition temperature of FeRh thin films was around 380 K. Both M-T curve and d-spacing changes correspond to each other very closely. Abrupt changes in the lattice constants can be observed from the in-situ analysis. Also, there is the likelihood of existence of a new phase.
Keywords :
X-ray diffraction; epitaxial growth; ferromagnetic-antiferromagnetic transitions; iron alloys; lattice constants; magnetic transition temperature; metallic epitaxial layers; rhodium alloys; FeRh; MgO(001) substrate; antiferromagnetic-ferromagnetic phase transition; d-spacing; epitaxial growth; epitaxial thin films; in-situ synchrotron X-ray diffraction measurement; lattice constants; magnetic properties measure system; transition temperature; Heating; Lattices; Magnetic films; Magnetic properties; Materials science and technology; Substrates; Synchrotrons; Temperature; Transistors; X-ray diffraction;
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
DOI :
10.1109/INEC.2010.5424542
