DocumentCode
1657391
Title
CMOS imager design for fast centroid readout
Author
Thomas, Cedric ; Hornsey, Richard ; Yip, Kelly
Author_Institution
Dept. of Comput. Sci., York Univ., Toronto, Ont., Canada
Volume
4
fYear
2004
Firstpage
2315
Abstract
Numerous applications of imaging systems involve the determination of the centroid location of a localized region of high intensity (a "spot") that is easily distinguished from the background. The goal of this work was to tailor the design of a custom CMOS imager to facilitate the centroid-location task. On-pixel circuitry, readout methods, on-chip post-readout processing and other factors were considered in the design process. The \´design process\´ included system modeling, simulation and experimental validation as well as chip-level design. A triangulation rangefinder instrument was constructed to evaluate imager alternatives. The precision of the range determination is proportional to the precision of the location of the centroid of the image of an optical spot. Range measurements are presented to demonstrate that uncertainty in centroid position, the dominant error source, can be significantly reduced by averaging. A novel CMOS imager design concept is described. Using on-chip processing and a \´pixel-binary\´, row/column-parallel readout scheme, range values are expected to have an update rate as high as 1 MHz. Key aspects of the chip design are evaluated, especially as they pertain to update rate and the use of on-chip averaging to enhance precision.
Keywords
CMOS image sensors; circuit simulation; distance measurement; error analysis; image processing; integrated circuit design; integrated circuit modelling; 1 MHz; CMOS imager design; centroid position uncertainty; centroid-location task; chip-level design; custom CMOS imager; dominant error source; experimental validation; fast centroid readout; imaging systems; localized high intensity region centroid location; on-chip averaging; on-chip post-readout processing; on-pixel circuitry; optical spot image centroid; pixel-binary row-column parallel readout scheme; range measurements; range update rate; readout methods; simulation; system modeling; triangulation rangefinder instrument; CMOS image sensors; CMOS technology; Circuits; Computer science; Optical arrays; Optical imaging; Optical sensors; Pixel; Process design; Sensor arrays;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Computer Engineering, 2004. Canadian Conference on
ISSN
0840-7789
Print_ISBN
0-7803-8253-6
Type
conf
DOI
10.1109/CCECE.2004.1347709
Filename
1347709
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