DocumentCode
1657445
Title
BIST Techniques for ASIC Design
Author
McLeod, Gordon R.
fYear
1992
Firstpage
496
Keywords
Analytical models; Application specific integrated circuits; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Costs; Flip-flops; Silicon; State feedback;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1992. Proceedings., International
ISSN
1089-3539
Print_ISBN
0-7803-0760-7
Type
conf
DOI
10.1109/TEST.1992.527861
Filename
527861
Link To Document