مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

1657445

Title :

BIST Techniques for ASIC Design

Author :

McLeod, Gordon R.

fYear :

1992

Firstpage :

496

Keywords :

Analytical models; Application specific integrated circuits; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Costs; Flip-flops; Silicon; State feedback;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Conference, 1992. Proceedings., International

ISSN :

1089-3539

Print_ISBN :

0-7803-0760-7

Type :

conf

DOI :

10.1109/TEST.1992.527861

Filename :

527861

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1657445