• DocumentCode
    1657495
  • Title

    Notice of Retraction
    Improving quality amp; manufacturability by Design for Six Sigma

  • Author

    Wu, Jin Jei ; Wang, Y.Z. ; Cai, W.S. ; Shao, J.J.

  • Author_Institution
    Dept. of Mech. & Electr. Eng., Jiangxi Univ. of Sci. & Technol., Ganzhou, China
  • Volume
    3
  • fYear
    2010
  • Firstpage
    262
  • Lastpage
    266
  • Abstract
    Notice of Retraction

    After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.

    We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.

    The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.

    In this paper, a new Design for Six Sigma(DFSS) integrating Artificial Neural Network approach is presented for improving quality and manufacturability simultaneously. Followed the neural network based on optimal DFSS method is employed as a tool in cutting parameters optimization. The results showed the roller burnishing formation can be controlled by adjusted cutting parameters with DFSS. The experiments proved the roller burnishing size with quality assurance method improved as much as 71 to 79 % comparing with conventional cutting condition. As a matter of fact, the parameters optimization by DFSS method is offering an effective tool to control the roller burnishing size in machining.
  • Keywords
    burnishing; cutting; design for quality; machining; neurocontrollers; optimisation; quality assurance; six sigma (quality); artificial neural network approach; cutting parameters optimization; design for six sigma; machining; manufacturability; optimal DFSS method; quality assurance method; roller burnishing formation; Artificial neural networks; Burnishing; Gallium nitride; Magnetic analysis; Artificial Neural Network; DFSS; Manufacturability; Quality;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Management Science (ICAMS), 2010 IEEE International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-6931-4
  • Type

    conf

  • DOI
    10.1109/ICAMS.2010.5553241
  • Filename
    5553241