DocumentCode
1657619
Title
ScanBist A Multi-frequency Scan-Based BIST Method
Author
Nadeau-Dostie, Benoit ; Burek, Dwayne ; Hassan, Abu S M
fYear
1992
Firstpage
506
Keywords
Automatic test pattern generation; Built-in self-test; Circuit faults; Circuit testing; Clocks; Frequency conversion; Frequency synchronization; Logic testing; Protocols; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1992. Proceedings., International
ISSN
1089-3539
Print_ISBN
0-7803-0760-7
Type
conf
DOI
10.1109/TEST.1992.527862
Filename
527862
Link To Document