Title :
Built-in self-test for programmable I/O buffers in FPGAs and SoCs
Author :
Vemula, Sudheer ; Stroud, Charles
Author_Institution :
Dept. of Electr. & Comput. Eng., Auburn Univ., AL
Abstract :
The first built-in self-test (BIST) approach for the programmable input/output (I/O) buffers in field programmable gate arrays (FPGAs) and configurable system-on-chip (SoC) implementations is presented. The I/O buffers are tested for their various modes of operation along with their associated programmable routing sources. A general BIST architecture, applicable to any FPGA or SoC with embedded FPGA core, is presented along with the capabilities and limitations of the approach. Experimental results are presented for BIST configurations developed for the I/O buffers in FPGAs including Atmel AT40K and Xilinx Virtex series as well as SoCs including Atmel AT94K series
Keywords :
buffer circuits; integrated circuit testing; programmable circuits; system-on-chip; Atmel AT40K series; Xilinx Virtex series; associated programmable routing sources; built-in self-test approach; configurable system-on-chip; field programmable gate arrays; programmable I/O buffers; programmable input/output buffers; Automatic testing; Built-in self-test; Field programmable gate arrays; Logic testing; Programmable logic arrays; Programmable logic devices; Reconfigurable logic; Routing; System testing; System-on-a-chip;
Conference_Titel :
System Theory, 2006. SSST '06. Proceeding of the Thirty-Eighth Southeastern Symposium on
Conference_Location :
Cookeville, TN
Print_ISBN :
0-7803-9457-7
DOI :
10.1109/SSST.2006.1619132
