Title :
The Research of Copper Leaching from the Waste Computer Mainboards
Author :
Li Jing-Ying ; Sheng Guang-Neng
Author_Institution :
Dept. of Environ. & Security Eng., Qingdao Univ. of Sci. & Technol., Qingdao
Abstract :
In this study, a new hydrometallurgical recovery technology of leaching copper from waste computer mainboards (WCM) has been presented using ammonia-ammonium chloride buffering solution as leachant and hydrogen peroxide solution ( AR, 30% w/w) as oxidant. The influences of aqueous ammonia concentration, ammonium chloride concentration, dose of hydrogen peroxide, reaction temperature and leaching time were investigated experimentally. The results indicated that increasing reaction temperature by externally heating appeared to be negligible effect on the recovery efficiency of copper and other factors were considerable contribution to copper recovery. It was favorable for copper recovery when solid-liquid ratio was 1:30, under the condition of 50 ml NH4OH(l:l), 20ml NH4Cl(2.0 mol/L), 6 ml H2O2 solution, 2 h leaching time and at room temperature(298K). The best dissolution rate of copper reached about 98% in this favorably experimental condition, which suggested this technological viability of copper recovery. On the basis of practice, this recycling was an environment-friendly and energy-saving recycling technology and expected to be a great potential.
Keywords :
copper; environmental management; leaching; metallurgy; microcomputers; recycling; scrap metal; ammonia-ammonium chloride buffering solution; ammonium chloride concentration; aqueous ammonia concentration; copper leaching; copper recovery; hydrogen peroxide solution; hydrometallurgical recovery technology; leachant; oxidant; reaction temperature; recycling; waste computer mainboards; Computer security; Copper; Costs; Energy consumption; Hazardous materials; Leaching; Microcomputers; Pollution; Recycling; Temperature;
Conference_Titel :
Bioinformatics and Biomedical Engineering, 2008. ICBBE 2008. The 2nd International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-1747-6
Electronic_ISBN :
978-1-4244-1748-3
DOI :
10.1109/ICBBE.2008.324