Title :
A fast testing method for sequential circuits at the state transition level
Author :
Wang, Wei-Lun ; Wang, Jhing-Fa ; Lee, Kuen-Jong
Keywords :
Circuit faults; Circuit testing; Controllability; Hardware; Logic gates; Logic testing; Observability; Pins; Sequential analysis; Sequential circuits;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527863
